Spring 2019 Physics Gala
The Ellipsometry group at New Mexico State University is a research group led by Department Head Dr. Stefan Zollner. We specialize in the characterization of the electronic and atomic structures of thin films and bulk materials.
By use of a variable angle spectroscopic ellipsometer and a cryostat we are able to precisely study the temperature and strain dependence of a materials dielectric function among other things. X-Ray diffraction and reflectance allows us to determine the film quality, thickness, relative orientation to the substrate, etc.
Our current interests consist of predominately novel materials, oxides, and classic semiconductors.
We are always looking to hire passionate able undergraduates, graduates, and interns. As a part of our group one is given the opportunity to take a more hands on approach to understanding electricity and magnetism and magnetic waves.
If you would like to know more about our group or the physics department at New Mexico State University feel free to contact Dr. Zollner.